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Products

Probe

PL Optics probes feature imported tungsten steel tips, ultra-fine flexible wires, and proprietary gold-plating, covering 1 fA–1 A current range with multiple tip diameters—ideal for I/O, wafer, solar cell, and photocurrent testing

產(chǎn)品介紹

As one of the core components of a probe station, the probe is responsible for making contact with the electrode of the device under test (DUT), providing a conductive path for electrical parameter measurements of semiconductor chips.

Depending on the application scenario, probes are available in various types, including:Tungsten probes；Gold-plated tungsten probes；Gold-plated flexible probes；Angled tungsten probes.

These probes are widely used in semiconductor and optoelectronic industries for device testing and characterization.

Technical Advantages:

  • ● Imported tungsten steel probe tips with excellent electrical conductivity

  • ● Ultra-fine and flexible probe wires minimize damage to integrated circuits

  • ● Proprietary gold-plating process enhances conductivity while maintaining mechanical integrity

  • ● Multiple tip diameters available to meet diverse application needs

  • ● Current measurement range: 1?fA to 1?A

  • ● Probes are available in multiple types to suit different testing scenarios

Model List：


Product NameModelLength (mm)Tip Diameter (μm)
Tungsten ProbePTR-01381 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Gold-Plated Tungsten ProbePCR-01381 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Gold-Plated Flexible ProbePSR-01515 / 10 / 30 / 50 / 125
Angled Tungsten ProbeLR-01321 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Beryllium Copper ProbePBR-01383 / 10 / 30

Application Areas：

I/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing


標(biāo)簽：

025-86550730