Beam Quality Analyzer
PL Optics Beam Quality Analyzer captures laser beam cross-sectional profiles to deliver precise M2 factor, spot diameter, and intensity centroid measurements. Available in visible (300–1100 nm) and NIR (400–1700 nm) versions with high-speed CCD/CMOS sensors, real-time exposure control, and USB 3.0/GigE interfaces for semiconductor, fiber, and ultrafast laser QA.
Beam Quality Analyzer captures the cross-sectional beam profile at a given location for precise, quantitative analysis of intensity distribution, beam shape, and spot size. Using a high-speed CCD or CMOS sensor, it records pixel-by-pixel intensity data to reconstruct the overall beam profile and calculate results such as beam diameter and intensity centroid.
Offered by Pulim Optoelectronics, our analyzers support both real-time exposure and gain control, with integrated attenuation solutions. They are widely used in semiconductor, solid-state, fiber, and ultrafast lasers, as well as laser ranging.
Visible-Light Beam Quality Analyzer
Product Features:
- ● High resolution & small pixel size
- ● Compatible with pulsed & CW lasers
- ● Spot diameter range: 22?μm–22?mm
- ● Manual & automatic real-time exposure/gain control
- ● Compact design with bracket & attenuation
- ● High-speed USB?3.0 / GigE interface
Applications:
- ● Laser spot inspection
- ● Optical component QA
- ● Laser cavity alignment
- ● Beam path collimation
- ● Fiber coupling analysis
- ● Laser processing monitoring
Technical Specifications:
| Model | BAS4.3-1100 | BAS7.1-1100 | BAS10.4-1100 | BAS15-1100 |
|---|
| Wavelength | 300–1100?nm | 300–1100?nm | 300–1100?nm | 300–1100?nm |
| Sensor Size | 5.7×4.3?mm | 8.4×7.1?mm | 14.1×10.4?mm | 15.8×21?mm |
| Pixel Size | 2.2?μm | 3.45?μm | 3.45?μm | 6?μm |
| Min. Working Distance | 6?mm | 6?mm | 6?mm | 6?mm |
| Exposure | 0.05–500?ms | 0.05–500?ms | 0.05–500?ms | 0.05–500?ms |
| Shutter | Rolling | Global | Global | Global |
| Spot Range | 22?μm–4.3?mm | 34.5?μm–7.1?mm | 34.5?μm–10.4?mm | 60?μm–15?mm |
| Max. Power Density | 50?W/cm2 (OD?3.5) | 50?W/cm2 (OD?3.5) | 50?W/cm2 (OD?3.5) | 50?W/cm2 (OD?3.5) |
| Interface | USB?3.0 | USB?3.0 | USB?3.0 | USB?3.0 |
| Trigger | No | Yes | Yes | Yes |
| Weight | <500?g | <500?g | <500?g | <500?g |
Near-Infrared Beam Quality Analyzer
Product Features:
- ● 400–1700?nm response range
- ● Real-time beam shape & position monitoring
- ● High resolution & accuracy
- ● USB?3.0 / GigE interface
- ● Compatible with CW & pulsed lasers
Applications:
- ● Infrared beam profiling
- ● Optoelectronic manufacturing control
- ● Laser testing & inspection
- ● Fiber inspection
- ● Laser process monitoring
Technical Specifications:
| Model | BASN2.6-1700 | BASN5-1700 |
|---|
| Wavelength | 400–1700?nm | 400–1700?nm |
| Sensor Size | 3.2×2.6?mm | 6.4×5.1?mm |
| Pixel Size | 5×5?μm | 5×5?μm |
| Sensor Type | InGaAs | InGaAs |
| Resolution | 656×520 | 1280×1024 |
| Spot Range | 50?μm–2.6?mm | 50?μm–5?mm |
Application Cases:
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